ORCID Profile
0000-0003-0624-2302
Current Organisation
Nanyang Technological University
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Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 11-2018
Publisher: Elsevier BV
Date: 07-2014
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 10-2004
Publisher: Elsevier BV
Date: 10-2003
Publisher: Elsevier BV
Date: 2013
DOI: 10.1016/J.ULTRAMIC.2012.08.003
Abstract: This paper presents a near-field ellipsometry method for nano-scale thin film characterization. The method is based on a reflection configuration of near-field optical detection. In the method, a new set of ellipsometry equations is established by taking into consideration the near-field s le-probe interaction and the topography of the thin film. Experimental and simulation results have shown that the proposed near-field ellipsometry is able to attain precise thin film characterization with nano-scale lateral resolution.
Publisher: Springer Science and Business Media LLC
Date: 19-05-2012
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 04-2006
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 04-2023
Publisher: Royal Society of Chemistry (RSC)
Date: 2010
DOI: 10.1039/B920412A
Publisher: Elsevier BV
Date: 12-2003
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 02-2003
Publisher: Informa UK Limited
Date: 2002
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 06-2004
Publisher: Elsevier BV
Date: 09-2003
Publisher: Informa UK Limited
Date: 22-05-2015
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 05-2008
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 03-2005
Publisher: Elsevier BV
Date: 2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2004
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 04-2012
Publisher: The Optical Society
Date: 04-10-2010
DOI: 10.1364/OE.18.022047
Publisher: Elsevier BV
Date: 03-2015
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 06-2007
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 03-2010
Publisher: Elsevier BV
Date: 2005
Publisher: Elsevier BV
Date: 06-2008
Publisher: Wiley
Date: 11-02-2011
DOI: 10.1002/RNC.1691
Publisher: Elsevier BV
Date: 03-2009
DOI: 10.1016/J.ULTRAMIC.2008.11.029
Abstract: This paper presents an approach for improving the Q-factor of tuning fork probe used in scanning probe microscopes. The improvement is achieved by balancing the fork prongs with extra mass attachment. An analytical model is proposed to characterize the Q-factor of a tuning fork probe with respect to the attachment of extra mass on the tuning fork prongs, and based on the model, the Q-factors of the unbalanced and balanced tuning fork probes are derived and compared. Experimental results showed that the model fits well the experimental data and the approach can improve the Q-factor by more than a factor of three. The effectiveness of the approach is further demonstrated by applying the balanced probe on an atomic force microscope to obtain improved topographic images.
Publisher: Elsevier BV
Date: 06-2013
Publisher: Elsevier BV
Date: 02-2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2010
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 11-2018
Publisher: SPIE-Intl Soc Optical Eng
Date: 08-2006
DOI: 10.1117/1.2280239
Publisher: Springer Science and Business Media LLC
Date: 06-04-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2009
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 02-2016
Publisher: SPIE-Intl Soc Optical Eng
Date: 2004
DOI: 10.1117/1.1627773
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 07-2019
Publisher: Elsevier BV
Date: 12-2011
Publisher: Elsevier BV
Date: 10-2010
Publisher: Elsevier BV
Date: 05-2008
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2023
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2006
Publisher: Elsevier BV
Date: 05-2005
Publisher: Elsevier BV
Date: 05-2005
Publisher: SPIE-Intl Soc Optical Eng
Date: 07-2006
DOI: 10.1117/1.2219096
Publisher: Elsevier BV
Date: 03-2004
Publisher: Wiley
Date: 18-11-2011
DOI: 10.1002/RNC.1822
Publisher: Springer Science and Business Media LLC
Date: 12-2010
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2014
Publisher: AIP Publishing
Date: 20-10-2008
DOI: 10.1063/1.3009560
Abstract: This letter reports the realization of liquid tunable long-period grating (LPG) using multiphase droplet microfluidics that is integrated onto a microfluidic chip. A stream of plugs is formed by two immiscible liquids and acted as LPG. It provides the tunability in the grating period by tuning the flow rates of the liquids, the refractive index and the index variation of the core layer by using different combinations of liquids. The experimental results show attenuation strength of 0.14 and attenuation bandwidth of 7.6nm. The chip is promising as a sensor for biochemical applications and a tunable filter for optical measurement.
Publisher: Elsevier BV
Date: 02-2006
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2007
Publisher: Institution of Engineering and Technology (IET)
Date: 21-07-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2023
Publisher: Elsevier BV
Date: 10-2010
Publisher: Elsevier BV
Date: 2016
Publisher: Hindawi Limited
Date: 2014
DOI: 10.1155/2014/589109
Abstract: This paper presents a speed and position estimation method for the permanent magnet synchronous motor (PMSM) based on higher-order sliding mode (HOSM) observer. The back electromotive forces (EMFs) in the PMSM are treated as unknown inputs and are estimated with the HOSM observer without the need of low-pass filter and phase compensation modules. With the estimation of back EMFs, an accurate estimation of speed and rotor position can be obtained. Further, the proposed method completely eliminates chattering. Experimental results with a 26 W three-phase PMSM demonstrate the effectiveness of the proposed method.
Publisher: Informa UK Limited
Date: 20-01-2004
Publisher: Wiley
Date: 2007
DOI: 10.1002/RNC.1154
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2005
Publisher: Springer Science and Business Media LLC
Date: 2005
DOI: 10.1155/JIA.2005.363
Publisher: SPIE-Intl Soc Optical Eng
Date: 27-07-2012
Publisher: Institution of Engineering and Technology (IET)
Date: 09-2007
Publisher: American Physical Society (APS)
Date: 15-12-2010
Publisher: Elsevier BV
Date: 09-2015
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2009
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2013
Publisher: Elsevier BV
Date: 12-2015
Publisher: Elsevier BV
Date: 12-2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2008
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2004
Publisher: Elsevier BV
Date: 03-2005
Publisher: Elsevier BV
Date: 03-2008
Publisher: Informa UK Limited
Date: 04-2012
Publisher: Elsevier BV
Date: 05-2010
DOI: 10.1016/J.ULTRAMIC.2010.02.022
Abstract: This paper presents a novel estimation scheme to calculate the probe-s le separation in atomic force microscopy (AFM). The AFM is capable of measuring the s le topography by using a probe to interact with the s le. The interaction is dominated by the atomic force which is dependent on the probe-s le separation and s le properties. The key to successful AFM applications is accurate sensing and regulation of the probe-s le separation in nanometer scale. Our proposed scheme provides an accurate estimate of the probe-s le separation based on the information of the main sinusoidal and its harmonics. The estimation is shown to have a good performance even when noise is present.
Publisher: Elsevier BV
Date: 05-2008
Publisher: AIP Publishing
Date: 22-02-2010
DOI: 10.1063/1.3326078
Abstract: This paper presents a set of formulae for estimating the beam position projected on a quadrant detector (QD). Our new formulae are designed through a systematic procedure to improve the measurement accuracy of the QD. It can be applied to different beam profiles. It is shown in simulations that our new formulae have achieved a much better measurement accuracy. It is also shown through experimental study that our approach is robust and able to achieve very good performance in practice.
Publisher: Elsevier BV
Date: 08-2004
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 07-2007
Publisher: The Optical Society
Date: 12-01-2011
DOI: 10.1364/OE.19.001324
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 11-2008
Publisher: AIP Publishing
Date: 08-11-2010
DOI: 10.1063/1.3518057
Abstract: An imaging scheme of shear-force atomic force microscope is proposed by exploiting the second resonance regime of the tuning fork probe. Theoretical analysis and experimental results demonstrate that the imaging scheme can deliver better sensitivity and higher resolution of topographic imaging.
Publisher: SPIE-Intl Soc Optical Eng
Date: 11-2003
DOI: 10.1117/1.1613279
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 08-2003
Publisher: SPIE-Intl Soc Optical Eng
Date: 12-2002
DOI: 10.1117/1.1518678
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2023
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2023
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 03-2019
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 04-2003
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 05-2019
Publisher: Elsevier BV
Date: 11-2004
Publisher: American Physical Society (APS)
Date: 09-10-2012
Publisher: Institution of Engineering and Technology (IET)
Date: 04-2014
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 07-2019
Publisher: Elsevier BV
Date: 11-2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2008
Publisher: Elsevier BV
Date: 02-2015
Publisher: The Optical Society
Date: 27-06-2013
DOI: 10.1364/AO.52.004652
Publisher: Wiley
Date: 25-03-2013
DOI: 10.1002/RNC.2982
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2013
Publisher: Informa UK Limited
Date: 03-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 02-2018
Publisher: Elsevier BV
Date: 08-2009
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2010
Publisher: Elsevier BV
Date: 04-2014
Publisher: SPIE-Intl Soc Optical Eng
Date: 12-2003
DOI: 10.1117/1.1625951
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 11-2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 10-2010
Publisher: Elsevier BV
Date: 07-2010
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2018
Publisher: SPIE-Intl Soc Optical Eng
Date: 05-2005
DOI: 10.1117/1.1907188
Publisher: Wiley
Date: 22-04-2009
DOI: 10.1111/J.1365-2818.2009.03160.X
Abstract: This paper presents a two coupled oscillators model to describe the dynamics of a tuning fork with a probe attached. The two coupled oscillators are unbalanced only in their effective masses and the d ing ratios. By applying a frequency domain system identification approach in experimental investigation of various probe attachment cases, a good accuracy of the model is demonstrated. The effectiveness of the model is further demonstrated in quantitative analysis of the noise performance and the sensitivity of force sensing with a tuning fork probe. Compared with existing models, the proposed model can more accurately characterize the dynamics of a tuning fork probe.
Publisher: Elsevier BV
Date: 10-2013
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2015
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2015
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2014
Publisher: Elsevier BV
Date: 12-2003
Publisher: SAGE Publications
Date: 12-02-2009
Abstract: This paper presents a systematic design methodology for reliable decentralized N-channel
Publisher: Informa UK Limited
Date: 15-12-2005
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2009
Publisher: Elsevier BV
Date: 04-2011
Publisher: Elsevier BV
Date: 2004
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2002
Publisher: Elsevier BV
Date: 09-2009
Publisher: Wiley
Date: 2009
DOI: 10.1002/RNC.1478
Publisher: Elsevier BV
Date: 10-2005
No related grants have been discovered for Yeng Chai Soh.