ORCID Profile
0000-0002-6271-7563
Current Organisation
Steam Instruments, Inc.
Does something not look right? The information on this page has been harvested from data sources that may not be up to date. We continue to work with information providers to improve coverage and quality. To report an issue, use the Feedback Form.
Publisher: Elsevier BV
Date: 11-2009
Publisher: American Vacuum Society
Date: 04-02-2016
DOI: 10.1116/1.4941140
Abstract: The ternary alloy Au7Cu5Al4 was irradiated with 0.1–10 keV Ar+ and the surface composition analyzed using laser sputter neutral mass spectrometry. Ejected clusters containing up to seven atoms, with masses up to 2000 amu, were observed. By monitoring the signals from sputtered clusters, the surface composition of the alloy was seen to change with 100 eV Ar+ dose, reaching equilibrium after 10 nm of the surface was eroded, in agreement with TRIDYN simulation and indicating that the changes were due to preferential sputtering of Al and Cu. Ejected gold containing clusters were found to increase markedly in intensity while aluminum containing clusters decreased in intensity as a result of Ar sputtering. Such an effect was most pronounced for low energy (& keV) Ar+ sputtering and was consistent with TRIDYN simulations of the depth profiling. The component sputter yields from the ternary alloy were consistent with previous binary alloy measurements but showed greater Cu surface concentrations than expected from TRIDYN simulations.
Publisher: Elsevier BV
Date: 05-2002
Publisher: Elsevier BV
Date: 12-2013
Publisher: Elsevier BV
Date: 06-2004
Publisher: Elsevier BV
Date: 07-2006
Publisher: SAGE Publications
Date: 02-2010
DOI: 10.1255/EJMS.1085
Abstract: There are four generally mutually exclusive requirements that plague many mass spectrometric measurements of trace constituents: (1) the small size (limited by the depth probed) of many interesting materials requires high useful yields to simply detect some trace elements, (2) the low concentrations of interesting elements require efficient discrimination from isobaric interferences, (3) it is often necessary to measure the depth distribution of elements with high surface and low bulk contributions, and (4) many applications require precise isotopic analysis. Resonant ionization mass spectrometry has made dramatic progress in addressing these difficulties over the past five years.
Publisher: Elsevier BV
Date: 03-2009
Publisher: Springer Science and Business Media LLC
Date: 15-06-2016
DOI: 10.1038/NCOMMS12006
Publisher: Elsevier BV
Date: 08-2009
Publisher: Wiley
Date: 2011
DOI: 10.1002/SIA.3523
Abstract: RIMS depth profiles have been measured for Cr and Ca in Genesis solar wind collector made from Si and compared to such measurements for ion‐implanted Si reference material. The presence of surface contamination has been shown to be a significant factor influencing the total Ca and Cr fluence measured in the Genesis collectors. A procedure to remove the contaminant signal from these depth profiles using the reference material implanted with a minor isotope demonstrated that 36% of the measured Ca fluence in our Genesis s le comes from terrestrial contamination. Copyright © 2010 John Wiley & Sons, Ltd.
Location: United States of America
Location: Uzbekistan
No related grants have been discovered for Igor Veryovkin.