ORCID Profile
0000-0003-1933-4986
Current Organisations
University of Sydney
,
Nanyang Technological University
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Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 05-2014
Publisher: IEEE
Date: 04-2007
Publisher: Springer Science and Business Media LLC
Date: 25-02-2019
Publisher: Springer Science and Business Media LLC
Date: 21-10-2010
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 02-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 10-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2010
Publisher: IEEE
Date: 06-2019
Publisher: IEEE
Date: 03-2017
Publisher: IEEE
Date: 12-2018
Publisher: IEEE
Date: 09-2011
Publisher: Springer Berlin Heidelberg
Date: 2008
Publisher: IEEE
Date: 2003
Publisher: IEEE
Date: 04-2007
Publisher: IEEE
Date: 11-2013
Publisher: IEEE
Date: 2005
Publisher: IEEE
Date: 03-2012
Publisher: IEEE
Date: 05-2019
Publisher: IEEE
Date: 05-2019
Publisher: IEEE
Date: 05-2019
Publisher: IEEE
Date: 2009
DOI: 10.1109/MDM.2009.107
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 03-2008
Publisher: IEEE
Date: 05-2009
Publisher: IEEE
Date: 09-2018
Publisher: IEEE
Date: 05-2011
Publisher: IEEE
Date: 05-2018
Publisher: IEEE
Date: 2003
Publisher: IEEE
Date: 07-2007
Publisher: IEEE
Date: 10-2006
Publisher: IEEE
Date: 09-2011
Publisher: IEEE
Date: 10-2011
Publisher: IEEE
Date: 05-2009
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 06-2010
Publisher: IEEE
Date: 2002
Publisher: Springer Science and Business Media LLC
Date: 04-06-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2007
Publisher: IEEE
Date: 05-2009
Publisher: Springer Berlin Heidelberg
Date: 2008
Publisher: Elsevier BV
Date: 04-2010
Publisher: IEEE
Date: 06-2008
Publisher: IEEE
Date: 2007
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2016
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 05-2006
Publisher: Elsevier BV
Date: 07-2013
Publisher: IEEE
Date: 05-2009
Publisher: IEEE
Date: 2005
Publisher: IEEE
Date: 10-2010
Publisher: IEEE
Date: 12-2009
Publisher: Elsevier BV
Date: 03-2009
Publisher: IEEE
Date: 10-2009
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 04-2014
Publisher: Elsevier BV
Date: 10-2017
Publisher: IEEE
Date: 07-2006
Publisher: Springer Science and Business Media LLC
Date: 24-05-2012
Publisher: IEEE
Date: 03-2012
Publisher: Elsevier BV
Date: 2010
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 04-2006
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 11-2009
Publisher: No publisher found
Publisher: IEEE
Date: 11-2018
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2017
Publisher: IEEE
Date: 09-2010
Publisher: Springer Science and Business Media LLC
Date: 12-11-2007
DOI: 10.1155/2007/19675
Publisher: IEEE
Date: 05-2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 10-2015
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2005
Publisher: IEEE
Date: 05-2015
Publisher: Elsevier BV
Date: 2014
Publisher: IEEE
Date: 05-2015
Publisher: IEEE
Date: 12-2011
Publisher: Springer Science and Business Media LLC
Date: 27-11-2010
Publisher: IEEE
Date: 09-2011
Publisher: IEEE
Date: 06-2008
Publisher: IEEE
Date: 03-2008
Publisher: IEEE
Date: 12-2011
Publisher: IEEE
Date: 05-2014
Publisher: IEEE
Date: 2005
Publisher: Elsevier BV
Date: 07-2008
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 07-2008
Publisher: SPIE-Intl Soc Optical Eng
Date: 2011
DOI: 10.1117/1.3554414
Publisher: IEEE
Date: 2005
Publisher: ACM
Date: 29-10-2012
Publisher: IEEE
Date: 05-2018
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 05-2020
Publisher: IEEE
Date: 12-2011
Publisher: IEEE
Date: 12-2009
Publisher: IEEE
Date: 12-2016
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2013
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 05-2005
Abstract: This paper proposes a blind image deconvolution scheme based on soft integration of parametric blur structures. Conventional blind image deconvolution methods encounter a difficult dilemma of either imposing stringent and inflexible preconditions on the problem formulation or experiencing poor restoration results due to lack of information. This paper attempts to address this issue by assessing the relevance of parametric blur information, and incorporating the knowledge into the parametric double regularization (PDR) scheme. The PDR method assumes that the actual blur satisfies up to a certain degree of parametric structure, as there are many well-known parametric blurs in practical applications. Further, it can be tailored flexibly to include other blur types if some prior parametric knowledge of the blur is available. A manifold soft parametric modeling technique is proposed to generate the blur manifolds, and estimate the fuzzy blur structure. The PDR scheme involves the development of the meaningful cost function, the estimation of blur support and structure, and the optimization of the cost function. Experimental results show that it is effective in restoring degraded images under different environments.
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 07-2013
Publisher: Springer Science and Business Media LLC
Date: 16-10-2012
Publisher: Springer Science and Business Media LLC
Date: 30-11-2007
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 07-2008
Publisher: IEEE
Date: 07-2006
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 11-2007
Abstract: This paper proposes a new algorithm to integrate image registration into image super-resolution (SR). Image SR is a process to reconstruct a high-resolution (HR) image by fusing multiple low-resolution (LR) images. A critical step in image SR is accurate registration of the LR images or, in other words, effective estimation of motion parameters. Conventional SR algorithms assume either the estimated motion parameters by existing registration methods to be error-free or the motion parameters are known a priori. This assumption, however, is impractical in many applications, as most existing registration algorithms still experience various degrees of errors, and the motion parameters among the LR images are generally unknown a priori. In view of this, this paper presents a new framework that performs simultaneous image registration and HR image reconstruction. As opposed to other current methods that treat image registration and HR reconstruction as disjoint processes, the new framework enables image registration and HR reconstruction to be estimated simultaneously and improved progressively. Further, unlike most algorithms that focus on the translational motion model, the proposed method adopts a more generic motion model that includes both translation as well as rotation. An iterative scheme is developed to solve the arising nonlinear least squares problem. Experimental results show that the proposed method is effective in performing image registration and SR for simulated as well as real-life images.
Publisher: IEEE
Date: 05-2018
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2002
DOI: 10.1109/4235.985688
Publisher: Elsevier BV
Date: 10-2013
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2010
DOI: 10.1109/MIS.2010.12
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 12-2008
Publisher: SPIE-Intl Soc Optical Eng
Date: 07-2000
DOI: 10.1117/1.602572
Publisher: Springer International Publishing
Date: 2019
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 02-2003
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 2023
Publisher: IEEE
Date: 03-2008
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 08-2012
No related grants have been discovered for Kim-Hui Yap.