ORCID Profile
0000-0002-5080-5670
Current Organisations
UNSW Sydney
,
BT Imaging Pty Ltd
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Publisher: Elsevier BV
Date: 09-2010
Publisher: Wiley
Date: 18-11-2022
Abstract: A novel, camera‐based method for direct implied open‐circuit voltage (i V OC ) imaging via the use of a single bandpass filter (s‐BPF) is developed for large‐area photovoltaic solar cells and precursors. The photoluminescence (PL) emission is imaged using a narrow BPF with centre energy inside the high‐energy tail of the PL emission, utilising the close‐to‐unity and nearly constant absorptivity of typical photovoltaic devices in this energy range. As a result, the exact value of the s le's absorptivity within the BPF transmission band is not required. The use of an s‐BPF enables a fully contactless approach to calibrate the absolute PL photon flux for spectrally integrated detectors, including cameras. The method eliminates the need for knowledge of the imaging system spectral response. Through an appropriate choice of the BPF centre energy, a range of absorber compositions or a single absorber with different surface morphologies, such as planar and textured, can be imaged, all without the need for additional detection optics. The feasibility of this s‐BPF method is first validated. The relative error in i V OC is determined to be ≤1.5%. The method is then demonstrated on device stacks with two different perovskite compositions commonly used in single‐junction and monolithic tandem solar cells.
Publisher: Trans Tech Publications, Ltd.
Date: 10-2014
DOI: 10.4028/WWW.SCIENTIFIC.NET/SSP.205-206.118
Abstract: Photoluminescence imaging techniques have recently been extended to silicon bricks for early production quality control and electronic characterisation in photovoltaics and microelectronics. This contribution reviews the state of the art of this new method which is fundamentally based on spectral luminescence analyses. We present highly resolved bulk lifetime images that can be rapidly extracted from the side faces of directionally solidified or Czochralski grown silicon bricks. It is discussed how detailed physical modelling and experimental verification give good confidence of the best practice measurement errors. It is also demonstrated that bulk lifetime imaging can further be used for doping and interstitial iron concentration imaging. Additionally, we show that full spectrum measurements allow verification of the luminescence modelling and are, when fitted to the theory, another accurate method of extracting the absolute bulk lifetime.
Publisher: Wiley
Date: 16-12-2017
Publisher: Elsevier BV
Date: 2006
Publisher: Wiley
Date: 23-03-2012
DOI: 10.1002/PIP.2184
Publisher: Elsevier BV
Date: 05-2009
Publisher: Wiley
Date: 27-03-2012
DOI: 10.1002/PIP.2180
Publisher: Elsevier BV
Date: 2012
Publisher: AIP Publishing
Date: 17-11-2008
DOI: 10.1063/1.2982588
Abstract: A technique for fast and spatially resolved measurement of the effective series resistance of silicon solar cells from luminescence images is introduced. Without compromising the speed of existing luminescence based series resistance imaging methods, this method offers significant advantages in that it is more robust against variations in local diode characteristics. Lateral variations in the series resistance of an industrial screen printed multicrystalline silicon solar cell obtained from this method show excellent correlation with a Corescan measurement and are also shown to be unaffected by lateral variations in the diode properties.
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Date: 09-2014
Publisher: SPIE
Date: 19-08-2010
DOI: 10.1117/12.862714
Publisher: AIP Publishing
Date: 15-04-2011
DOI: 10.1063/1.3575171
Publisher: Elsevier BV
Date: 08-2023
Publisher: AIP Publishing
Date: 15-09-2012
DOI: 10.1063/1.4752409
Abstract: Spectral photoluminescence imaging is able to provide quantitative bulk lifetime and doping images if applied on silicon bricks or thick silicon wafers. A comprehensive study of this new method addresses previously reported artefacts in low lifetime regions and provides a more complete understanding of the technique. Spectrally resolved photoluminescence measurements show that luminescence originating from sub band gap defects does not cause those artefacts. Rather, we find that optical light spreading within the silicon CCD is responsible for most of the distortion in image contrast and introduce a method to measure and remove this spreading via image deconvolution. Alternatively, image blur can be reduced systematically by using an InGaAs camera. Results of modelling this alternative camera type and experiments are shown and discussed in comparison. In addition to eliminating the blur effects, we find a superior accuracy for lifetimes above 100 μs with significantly shorter, but dark noise limited exposure times.
Publisher: Wiley
Date: 24-11-2015
DOI: 10.1002/PIP.2716
Publisher: Springer Science and Business Media LLC
Date: 07-06-2016
DOI: 10.1557/ADV.2016.424
Location: Germany
No related grants have been discovered for Juergen Weber.