Publication
Detecting Frost Stress in Wheat: A Controlled Environment Hyperspectral Study on Wheat Plant Components and Implications for Multispectral Field Sensing
Publisher:
MDPI AG
Date:
03-02-2020
DOI:
10.3390/RS12030477
Abstract: Radiant frost during the reproductive stage of plant growth can result in considerable wheat (Triticum aestivum L.) yield loss. Much effort has been spent to prevent and manage these losses, including post-frost remote sensing of damage. This study was done under controlled conditions to examine the effect of imposed frost stress on the spectral response of wheat plant components (heads and flag leaves). The approach used hyperspectral profiling to determine whether changes in wheat components were evident immediately after a frost (up to 5 days after frosting (DAF)). Significant differences were found between frost treatments, irrespective of DAF, in the Blue/Green (419–512 nanometers (nm)), Red (610–675 nm) and Near Infrared (NIR 749–889 nm) regions of the electromagnetic spectrum (EMS) in head spectra, and in the Blue (415–494 nm), Red (670–687 nm) and NIR (727–889 nm) regions in the leaf spectra. Significant differences were found for an interaction between time and frost treatment in the Green (544–575 nm) and NIR (756–889 nm) in head spectra, and in the UV (394–396 nm) and Green/Red (564–641 nm) in leaf spectra. These findings were compared with spectral and temporal resolutions of commonly used field agricultural multispectral sensors to examine their potential suitability for frost damage studies at the canopy scale, based on the correspondence of their multispectral bands to the results from this laboratory-based hyperspectral study.