Website
http://dataportal.arc.gov.au/NCGP/API/grants/LE0347797
Funding Status
Closed
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Funded Activity Summary
A Versatile High-resolution X-ray Diffractometer for Materials Research. The aim of this project is to establish a state-of-the-art triple-axis x-ray diffraction facility capable of non-destructively analysing complex semiconductor materials and structures investigated by all Australian semiconductor-growing groups. Growers and device engineers will be able to control growth processes accurately and correlate device performance with structural analysis. Modern triple-axis instruments can also be used for high-resolution texture analysis and surface reflectivity measurements on numerous types of materials. Thus chemists, geologists, and materials scientists with interests outside of the semiconductor growth community will gain substantial benefit from this instrument for the investigation of materials of technological and economic importance.Funded Activity Details
Start Date: 10-2003
End Date: 10-2004
Funding Scheme: Linkage Infrastructure, Equipment and Facilities
Funding Amount: $263,000.00
Funder: Australian Research Council
Research Topics
ANZSRC Field of Research (FoR)
Mathematical Physics | Condensed Matter Physics—Structural Properties
