Precise atomic-scale structure determination in thick nanostructures. This project aims to tackle a great challenge of atomic-scale characterisation: quantitative structure determination. Powerful new electron microscopes offer a window into the atomic world, but complex electron multiple scattering has limited reliable structure determination to ultrathin materials. This project expects to overcome this barrier. Anticipated outcomes include methods that use the latest detector technology to det ....Precise atomic-scale structure determination in thick nanostructures. This project aims to tackle a great challenge of atomic-scale characterisation: quantitative structure determination. Powerful new electron microscopes offer a window into the atomic world, but complex electron multiple scattering has limited reliable structure determination to ultrathin materials. This project expects to overcome this barrier. Anticipated outcomes include methods that use the latest detector technology to determine structure and interatomic bonding in much thicker nanostructures than hitherto possible. This should benefit academic and industrial researchers by giving them new tools to understand and design high-performance materials for applications ranging from catalysis to energy storage to next-generation electronics.Read moreRead less
Imaging Symmetry – A New Mechanism for Revealing the Structure of Matter. This project aims to develop a revolutionary method for imaging atomic structures. In this method, the image contrast derives from the symmetry of the structure, measured at the picometre scale, using tiny electron probes. This new conceptual approach is expected to overcome some of the key limitations of existing electron microscopy methods by providing increased sensitivity and reduced radiation damage, thereby enabling ....Imaging Symmetry – A New Mechanism for Revealing the Structure of Matter. This project aims to develop a revolutionary method for imaging atomic structures. In this method, the image contrast derives from the symmetry of the structure, measured at the picometre scale, using tiny electron probes. This new conceptual approach is expected to overcome some of the key limitations of existing electron microscopy methods by providing increased sensitivity and reduced radiation damage, thereby enabling complex structures in technologically important materials to be determined. This should provide new ways to understand the properties of these materials advanced materials and engineer them for applications in the energy, transport, health, communications and other sectors of society. Read moreRead less