Porosity in Si, Ge and the Si(x)Ge(1-x) alloys induced by ion irradiation. Ion beam methods will be used to form porous layers in Si, Ge and their alloys with a range of technological applications. The distributions of pore size and shape will be characterised with laboratory and synchrotron-based analytical techniques including a 3D reconstruction of the irradiation-induced porous structure.
A new in-situ structural measurement capability during nanoindentation. A new in-situ structural measurement capability during nanoindentation. This project aims to develop an in-situ Raman capability to obtain dynamic structural and mechanical behaviour of materials as a function of pressure during nanoindentation; and apply the new capability to directly monitor phase changes in silicon and germanium under pressure and correlate them with the simultaneous electrical responses. Anticipated outc ....A new in-situ structural measurement capability during nanoindentation. A new in-situ structural measurement capability during nanoindentation. This project aims to develop an in-situ Raman capability to obtain dynamic structural and mechanical behaviour of materials as a function of pressure during nanoindentation; and apply the new capability to directly monitor phase changes in silicon and germanium under pressure and correlate them with the simultaneous electrical responses. Anticipated outcomes are new instrumentation to directly probe the pressure-temperature phase diagram, and measure electrical properties of novel end phases in these semiconductors.Read moreRead less