Discovery Early Career Researcher Award - Grant ID: DE220100487
Funder
Australian Research Council
Funding Amount
$450,000.00
Summary
Thermal hotspots detection in nanoscale two-dimensional electronics. The emergence of flexible nanoelectronics holds the promise to impact the way we live—from smart wearables to foldable smartphones. However, heat dissipation in the atomically-thin materials used for their conception has remained poorly understood due to their planar structures. This project aims at the detection and mapping of nanoscale thermal hotspots in flexible nanoelectronics devices using a two-dimensional-based optical ....Thermal hotspots detection in nanoscale two-dimensional electronics. The emergence of flexible nanoelectronics holds the promise to impact the way we live—from smart wearables to foldable smartphones. However, heat dissipation in the atomically-thin materials used for their conception has remained poorly understood due to their planar structures. This project aims at the detection and mapping of nanoscale thermal hotspots in flexible nanoelectronics devices using a two-dimensional-based optical thermometer. The expected outcome of this project is the development of a non-invasive thermometric technology that enables locating these critical nanoscale hotspots with nanoscale precision. This will lead to better design and manufacturing strategies for heat dissipation in these devices.Read moreRead less
Discovery Early Career Researcher Award - Grant ID: DE240100507
Funder
Australian Research Council
Funding Amount
$444,471.00
Summary
Integrated active microcantilevers for high-throughput nanometrology. This project aims to develop a new versatile, high-performance microsensor platform and microscopy method for measuring nano-scale structures. The proposed microscopy tool is expected to significantly increase imaging speed and miniaturize system footprint, thereby enabling high-throughput quality control of semiconductor devices. The expected outcome is a highly-scalable and low-cost imaging system that will close the technol ....Integrated active microcantilevers for high-throughput nanometrology. This project aims to develop a new versatile, high-performance microsensor platform and microscopy method for measuring nano-scale structures. The proposed microscopy tool is expected to significantly increase imaging speed and miniaturize system footprint, thereby enabling high-throughput quality control of semiconductor devices. The expected outcome is a highly-scalable and low-cost imaging system that will close the technology gap between fabrication and inspection at the nanoscale. The benefits to Australia should include the potential for commercialization to develop this next-generation microscopy tool in high-value market sectors.Read moreRead less