Surface Integrity Characterization of Sapphire Wafers for Wireless and Fibre Optic Semiconductor Industry. This project aims to uncover the mechanism of surface integrity in sapphire wafers and thus to establish its relationship with the quality processing of integrated circuits. The project will comprehensively consider surface damage, residual stresses, thermal shock and dislocation evolution as an organic whole to provide an effective solution to the problems in the current production practic ....Surface Integrity Characterization of Sapphire Wafers for Wireless and Fibre Optic Semiconductor Industry. This project aims to uncover the mechanism of surface integrity in sapphire wafers and thus to establish its relationship with the quality processing of integrated circuits. The project will comprehensively consider surface damage, residual stresses, thermal shock and dislocation evolution as an organic whole to provide an effective solution to the problems in the current production practice. Problems caused by unsatisfactory surface integrity represent a major outlay for the wireless and fibre optic semiconductor industry. The proposed research holds the very real possibility of reducing the capital cost and enhancing the quality of the integrated circuits of high capacity.Read moreRead less