Maarten Vos

Electron correlation effects in the spectral momentum density of graphite

Publisher: American Physical Society (APS)

Date: 02-01-2001

DOI: 10.1103/PHYSREVB.63.033108

Determination of the energy-momentum densities of aluminium by electron momentum spectroscopy

Publisher: IOP Publishing

Date: 1999

DOI: 10.1088/0953-8984/11/18/302

Preparation of a 10 nm thick single-crystal silicon membrane self-supporting over a diameter of 1 mm

Publisher: Elsevier BV

Date: 08-2000

DOI: 10.1016/S0169-4332(00)00216-6

Influence of electron diffraction on measured energy-resolved momentum densities in single-crystalline silicon

Publisher: Elsevier BV

Date: 12-2003

DOI: 10.1016/J.JPCS.2003.08.004

Three-dimensional electron momentum densities:A comparison of (γ,eγ) and (e,2e) spectroscopies

Publisher: American Physical Society (APS)

Date: 15-02-1997

DOI: 10.1103/PHYSREVB.55.5440

Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface

Publisher: Wiley

Date: 2006

DOI: 10.1002/SIA.2385

Determination of thickness and composition of high-k dielectrics using high-energy electrons

Publisher: AIP Publishing

Date: 12-08-2013

DOI: 10.1063/1.4818637

Abstract: We demonstrate the application of high-energy elastic electron backscattering to the analysis of thin (2–20 nm) HfO2 overlayers on oxidized Si substrates. The film composition and thickness are determined directly from elastic scattering peaks characteristic of each element. The stoichiometry of the films is determined with an accuracy of 5%–10%. The experimental results are corroborated by medium energy ions scattering and Rutherford backscattering spectrometry measurements, and clearly demonstrate the applicability of the technique for thin-film analysis. Significantly, the presented technique opens new possibilities for nm depth profiling with high spatial resolution in scanning electron microscopes.

Quantitative electron spectroscopy of 125I over an extended energy range

Publisher: Elsevier BV

Date: 04-2019

DOI: 10.1016/J.ELSPEC.2019.02.009

Analysis of multi-layer ERBS spectra

Publisher: Elsevier BV

Date: 07-2015

DOI: 10.1016/J.ELSPEC.2015.02.009

The electronic structure of different forms of solid carbon studied by electron momentum spectroscopy

Publisher: Elsevier BV

Date: 02-1998

DOI: 10.1016/S0368-2048(97)00101-1

Anisotropy of the electron momentum density of graphite studied by(γ,

Publisher: American Physical Society (APS)

Date: 30-03-2001

DOI: 10.1103/PHYSREVB.63.155204

Spectral properties of quasiparticles in silicon: A test of many-body theory

Publisher: American Physical Society (APS)

Date: 22-12-2003

DOI: 10.1103/PHYSREVB.68.233205

Direct imaging of the valence electronic structure of solids by (e,2e) spectroscopy

Publisher: Elsevier BV

Date: 07-1995

DOI: 10.1016/0038-1098(95)00222-7

Valence-band energy-momentum densities of amorphousSiO

Publisher: American Physical Society (APS)

Date: 15-02-1998

DOI: 10.1103/PHYSREVB.57.4349

Phase evolution in PLD MgB2 films during the in situ annealing process

Publisher: IOP Publishing

Date: 18-10-2007

DOI: 10.1088/0953-2048/20/11/S32

Energy-momentum density of graphite by(e,2

Publisher: American Physical Society (APS)

Date: 15-07-1997

DOI: 10.1103/PHYSREVB.56.963

The effect of ion implantation on reflection electron energy loss spectroscopy: The case of Au implanted Al films

Publisher: Elsevier BV

Date: 04-2020

DOI: 10.1016/J.ELSPEC.2020.146935

Room temperature synthesis of HfO₂/HfO _x heterostructures by ion-implantation

Publisher: IOP Publishing

Date: 15-08-2018

DOI: 10.1088/1361-6528/AAD756

Abstract: Implantation of Hf films with oxygen ions is shown to be an effective means of fabricating high-quality HfO

Electronic-structure investigation of oxidized aluminum films with electron-momentum spectroscopy

Publisher: American Physical Society (APS)

Date: 15-12-1996

DOI: 10.1103/PHYSREVB.54.17943

Measurement of the spectral momentum distribution of valence electrons in amorphous carbon by (e,2e) spectroscopy

Publisher: American Physical Society (APS)

Date: 15-01-1994

DOI: 10.1103/PHYSREVB.49.2113

Quantitative measurement of the spectral function of aluminum and lithium by electron momentum spectroscopy

Publisher: American Physical Society (APS)

Date: 23-10-2002

DOI: 10.1103/PHYSREVB.66.155414

Spectral momentum density of electrons in copper

Publisher: American Physical Society (APS)

Date: 15-03-1998

DOI: 10.1103/PHYSREVB.57.6333

Surface characterization of diamond-like amorphous carbon foils by (e,2e) spectroscopy and transmission electron energy loss spectroscopy

Publisher: IOP Publishing

Date: 14-11-1995

DOI: 10.1088/0022-3727/28/11/017

Absence of interchannel coupling in electron momentum spectroscopy

Publisher: American Physical Society (APS)

Date: 10-1998

DOI: 10.1103/PHYSREVA.58.2815

A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices

Publisher: AIP Publishing

Date: 20-08-2013

DOI: 10.1063/1.4818524

Abstract: High-energy electron scattering is used to investigate Ta films implanted with 10 keV O ions. These films are of interest as they have been used for the fabrication of memristors. High-energy electron scattering is used with incoming electron energies ranging from 5 to 40 keV. The inelastic mean free path, and hence the probing depth, is at these energies of the same order as the range of the implanted ions. At the same time, we can distinguish the mass of the atom that scattered the electron elastically, due to the dependence of the recoil energy on the mass of the scatterer. This allows us to determine quantitatively the atomic composition near the surface from the signal of electrons that have scattered elastically but not inelastically. Electrons that have scattered inelastically as well as elastically provide us with information on the possible electronic excitations. Their signal is used to monitor the presence of the Ta2O5 phase near the surface (characterised by a significant band gap of ≃4.5 eV), and estimate at what depth below the surface pure Ta metal is present. In this way, we obtain a fairly detailed picture of the elemental composition and electronic properties of these films.

Electronic structure of amorphous Si measured by (e,2e) spectroscopy

Publisher: IOP Publishing

Date: 09-01-1995

DOI: 10.1088/0953-8984/7/2/006

Elastic and inelastic scattering in electron momentum spectroscopy of amorphous Ge films

Publisher: Elsevier BV

Date: 06-2006

DOI: 10.1016/J.ELSPEC.2006.03.005

Energy-resolved electron-momentum densities of graphite films

Publisher: American Physical Society (APS)

Date: 15-08-1994

DOI: 10.1103/PHYSREVB.50.5635

Spectral electron momentum density calculation in graphite

Publisher: IOP Publishing

Date: 15-05-1995

DOI: 10.1088/0953-8984/7/20/009

The direct measurement of spectral momentum densities of silicon with high energy spectroscopy

Publisher: Elsevier BV

Date: 12-2004

DOI: 10.1016/J.ELSPEC.2004.05.006

Electron momentum spectroscopy studies on the oxidation of aluminium

Publisher: Elsevier BV

Date: 06-1997

DOI: 10.1016/S0039-6028(97)00155-6

Passive donor-to-recipient transfer of antiphospholipid syndrome following allogeneic stem-cell transplantation

Publisher: Wiley

Date: 2005

DOI: 10.1002/AJH.20350

Measured energy - momentum densities of the valence band of aluminium

Publisher: IOP Publishing

Date: 03-03-1997

DOI: 10.1088/0953-8984/9/9/008

The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbO x films

Publisher: Elsevier BV

Date: 12-2014

DOI: 10.1016/J.NIMB.2014.06.024

Valence electronic structure of polycrystalline SiC as observed by (e,2e) spectroscopy

Publisher: American Physical Society (APS)

Date: 02-1995

DOI: 10.1103/PHYSREVB.51.3449

Measurement of the intensity ratio of Auger and conversion electrons for the electron capture decay of ¹²⁵I

Publisher: IOP Publishing

Date: 21-03-2018

DOI: 10.1088/1361-6560/AAB24B

Abstract: Auger electrons emitted after nuclear decay have potential application in targeted cancer therapy. For this purpose it is important to know the Auger electron yield per nuclear decay. In this work we describe a measurement of the ratio of the number of conversion electrons (emitted as part of the nuclear decay process) to the number of Auger electrons (emitted as part of the atomic relaxation process after the nuclear decay) for the case of

Band structure of silicon as measured in extended momentum space

Publisher: American Physical Society (APS)

Date: 27-02-2006

DOI: 10.1103/PHYSREVB.73.085207

The Spectral Momentum Density of Aluminium, Copper and Gold Measured by Electron Momentum Spectroscopy

Publisher: Walter de Gruyter GmbH

Date: 2001

DOI: 10.1524/ZPCH.2001.215.10.1323

Abstract: Electron momentum spectroscopy (EMS) gives direct information of the full energy-resolved electron momentum densities of occupied states (bands) in solids – single crystal, polycrystalline or amorphous. Here we present data from a new high energy EMS spectrometer using 50 keV incident and 25 keV outgoing electrons, on polycrystalline specimens of aluminium, copper and gold. The spectral momentum densities show very significant electron-electron correlation effects which are in good agreement with many-body Green´s function calculations.

Spectral momentum densities of vanadium and vanadium oxide as measured by high energy (e, 2e) spectroscopy

Publisher: IOP Publishing

Date: 11-11-2005

DOI: 10.1088/0953-8984/17/48/019

Linkage Infrastructure, Equipment And Facilities - Grant ID: LE0453842

Start Date: 11-2003

End Date: 11-2005

Amount: $590,309.00

Funder: Australian Research Council

Discovery Projects - Grant ID: DP0663155

Start Date: 2006

End Date: 12-2009

Amount: $335,000.00

Funder: Australian Research Council

Discovery Projects - Grant ID: DP0343283

Start Date: 2003

End Date: 12-2005

Amount: $295,000.00

Funder: Australian Research Council

Discovery Projects - Grant ID: DP0557047

Start Date: 2005

End Date: 12-2008

Amount: $280,000.00

Funder: Australian Research Council

Discovery Projects - Grant ID: DP140103317

Start Date: 2014

End Date: 12-2016

Amount: $453,000.00

Funder: Australian Research Council

Discovery Projects - Grant ID: DP1093331

Start Date: 06-2010

End Date: 03-2014

Amount: $350,000.00

Funder: Australian Research Council

Special Research Initiatives - Grant ID: SR0354591

Start Date: 01-2004

End Date: 12-2003

Amount: $10,000.00

Funder: Australian Research Council