Website
http://dataportal.arc.gov.au/NCGP/API/grants/LE160100063
Funding Status
Closed
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Funded Activity Summary
Focused ion beam microscope for trace element analysis and nanomachining. Focused ion beam microscope for trace element analysis and nanomachining: This project aims to fill the critical gap in 3-D imaging and compositional characterisation of metals, functional materials, polymers, biomaterials, ceramics and minerals at micro- and nano-scales. Coupling of dual column focused ion beam microscopy with secondary ion mass spectroscopy analysis will is designed to overcome the long-standing limitation of light and trace element analysis in scanning electron microscopes. This facility would provide Australian researchers with a new capability of characterising light and trace elements using scanning electron microscopy. Along with the ability to characterise a diverse range of materials in 3-D, the new system would enable fabrication of functional nanoscale devices for nanotechnology, biomedical and energy applications.Funded Activity Details
Start Date: 2016
End Date: 12-2016
Funding Scheme: Linkage Infrastructure, Equipment and Facilities
Funding Amount: $980,000.00
Funder: Australian Research Council
Research Topics
ANZSRC Field of Research (FoR)
Materials Engineering not elsewhere classified | Condensed Matter Imaging | Analytical Spectrometry | Materials Engineering
ANZSRC Socio-Economic Objective (SEO)
Expanding Knowledge in the Chemical Sciences | Expanding Knowledge in the Physical Sciences | Expanding Knowledge in Engineering |
